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Department of Materials Science and Engineering

High Resolution Hyper Probe JXA-iHP8500F (EPMA 8500F)

Number 16
Location Materials Science & Technology Building R129-A
Purpose EPMA can do micro area qualitative analysis and quantitative analysis of metal materials, electro materials, ceramics, minerals. EPMA can detect characteristics X-ray, secondary electron, backscattering electron image within a large area and high magnification (up to 100,000X) and the accuracy is higher than common EDS which makes EPMA a fine tool of microanalysis.
Person in Charge 宋瑞文
Contact Email sourgein@gmail.com
Phone 03-5715131#33857

 

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