Jump to the main content block

Department of Materials Science and Engineering

高解析度場發射電子微探儀(EPMA 200F)

Number 17
Location Materials Science & Technology Building R112
Purpose EPMA can do micro area qualitative analysis and quantitative analysis of metal materials, electro materials, ceramics, minerals. EPMA can detect characteristics X-ray, secondary electron, backscattering electron image within a large area and high magnification (up to 100,000X) and the accuracy is higher than common EDS which makes EPMA a fine tool of microanalysis.
Person in Charge 許聖右
Contact Email ru5560139@gmail.com
Phone 03-5715131#33857


Click Num: