高解析度場發射電子微探儀(EPMA 200F)
Number | 17 |
Location | Materials Science & Technology Building R112 |
Purpose | EPMA can do micro area qualitative analysis and quantitative analysis of metal materials, electro materials, ceramics, minerals. EPMA can detect characteristics X-ray, secondary electron, backscattering electron image within a large area and high magnification (up to 100,000X) and the accuracy is higher than common EDS which makes EPMA a fine tool of microanalysis. |
Person in Charge | 許聖右 |
Contact Email | ru5560139@gmail.com |
Phone | 03-5715131#33857 |