X-RAY DIFFRACTOMETER （MAC Science_MXP18）
| No. | 3100709-21-000003 |
| Location | Materials Science & Technology Building R127 |
| 用途 | Crystallinity Analysis（Qualitative and Quantitative）、Crystal Size Analysis、Residual Stress Analysis、Pole Figure PS：Scan method 低掠角（GIXD）繞射（2θ） |
| 管理者 | Liau Jeng Hua |
| Phone | 03-5715131#33853 |