材料科學工程學系
X-RASY DIFFRACTION（Rigaku_TTRAXⅢ）
| No. | 097 |
| Location | Materials Science & Technology Building R125 |
| 用途 | Crystal Structure、Quanlitative and Qrientation Analysis；Thin-Film Sample Profile、Thickness、Roughness、Density and Mutilayer film Composition Analysis；Particle/Porous Size Distribution Analysis |
| 管理者 | |
| Phone | 03-5715131#35415 |