Spherical-aberration Corrected Field Emission TEM ARM-200FTH
| Number | 7 |
| Location | Alloy Laboratory Buliding 1F TEM Laboratory |
| Purpose | 1. Transmission electron microscope穿透式電子顯微鏡：明場像(bright-field (BF) image)/暗場像(dark-field (DF) image)/高分辨電鏡影像(high-resolution electron microscopy image, HRTEM image)。 2. 擇區繞射圖譜(selected area diffraction pattern, SADP)。 3. 掃描穿透式電鏡(scanning transmission electron microscope, STEM)：高角度環形暗場像(high angle annular dark field, HAADF)。 |
| Person in charge | Zhang, Jing 張敬 |
| Contact Email | escape119@hotmail.com |
| Phone | 03-5715131 #33829 |