| Number |
5 |
| Location |
Materials Science & Technology Building R113 |
| Purpose |
1. Normal TEM bright and dark field image, High Resolution Image can reach 0.1nm in HRTEM mode, and 0.12nm in STEM mode. 2. High-resolution scanning through transparent, dark field images (HR STEM BF and DF). 3. Nano-beam Diffraction micro-area diffraction analysis> 1nm. 4. CBED (Convergent Beam Electron Diffraction) converges the intensity distribution of the electron beam diffraction disc, and can analyze and obtain the three-dimensional data of the microstructure. 5. EDS energy dispersive spectrometer can provide qualitative and semi-quantitative chemical element mapping/linescan analysis in micro-area analysis. 6. The EELS electronic energy loss spectrometer can provide more accurate related data for microanalysis of light elements, chemical bonds, etc. Energy resolution can reach 1ev. |
| Person in charge |
蕭開元 |
| Contact Email |
jonathan80717500@gmail.com |
| Phone |
03-5715131#33865 |
