Field Emission Scanning Electron Microscope FESEM-8010
| Number | 2 |
| Location | Materials Science & Technology Building R115-C |
| Purpose | 1.Electron microscope observation (SEM): High magnification to observe the fine structure or cross-sectional structure of elements, films, etc. 2.Surface Energy Level Analysis (EDS): Electronic energy level spectrum analysis of the surface material composition at a specific location to determine the chemical composition |
| Person in charge | 郭君翰 |
| Contact Email | a910079day@gmail.com |
| Phone | 03-5715131#35362 |