| Number | 29 |
| Location | Materials Science & Technology Building R101-C |
| Purpose | The probe measurement system for component voltage, current (IV) measurement, and capacitance-voltage (CV) measurement can obtain mainly the basic resistance value of the component and its characteristics with different voltages. With the light source, it can also measure the light sensor components. |
| Person in Charge | Ying-Jun Shen 沈盈均 |
| Contact Email | kuroekyo@gmail.com |
| Phone | 03-5715131#35398 |